Experimental Observations of Stress-Driven Grain Boundary Migration
My coworkers (Dan Gianola, Yixiang Gan, and Kevin Hemker) and I have published research results in the December 18th, 2009 issue of Science. In this work, we perform tension tests on specially designed thin film samples to studying the influence of different stress and strain states on mechanically-induced grain growth in nanocrystalline aluminum. Our results indicate that shear stresses drive grain boundaries to move in a manner consistent with recent molecular dynamics simulations and theoretical predictions of coupled grain boundary migration.